HTOL Systems & Hardware

Reltech designs and manufactures its own HTOL test systems, qualification boards, driver cards, and with multiple socket vendors. Our hardware capability is what makes us a reliabilty partner — not just a service provider.

– HTOL Systems

Proprietary Life Test Platforms

Reltech’s HTOL systems are engineered by our own team, validated on our own test programmes, and built to outlast the qualification schedules they support.

Series 8000

HTOL System — Standard & Mid-Power

The Reltech 8000 Series is our principal HTOL platform — providing automated, multi-channel burn-in and life-testing under controlled temperature and programmable bias. Available in 25°C – 175°C configurations to support a wide range of device types from digital logic to linear ICs and power management devices.

Test Method

JEDEC JESD22-A108

Temp Range

+25°C to +175°C

Temperature Control

Individual DUT level

Channels

Up to 256 per system

Bias Voltage

Programmable per channel

Compliance

AEC Q-100 Grade 0–3

Monitoring

Real-time, device-level logging

Data Output

Automated report generation

Series 7000

HTOL / Burn-In Oven

Temperature Cycling and Power Cycling — thermomechanical fatigue testing to evaluate solder joint, die attach, and interconnect reliability under cyclic thermal stress. JEDEC JESD22-A104.

Test Method

JESD22-A108 / A110

Temp Range

+25°C to +200°C

Capacity

Up to 512 devices

Temperature Control

Single chamber environment

Uniformity

±1.5°C across chamber

Compliance

AEC Q-100 / Q-101

Monitoring

Real-time data logging

Screening

Dynamic & static burn-in

– System Accessories

Qualification Boards, Driver Cards & Sockets

A test system is only as capable as its test interface. Reltech provides the complete hardware stack — from qualification boards to custom sockets — ensuring electrical integrity from system to device.

Qualification Boards

Custom PCB design for biased test methods. Engineered to maintain electrical integrity at elevated temperatures, with device-under-test connections optimised for best technical performance.

Driver Cards

Programmable driver cards for voltage and signal bias application across device channels. Supports multi-rail supply configurations and per-channel parametric monitoring throughout the stress programme.

Test Sockets

Characterises the early failure population of a device lot — distinguishing infant mortality defects from intrinsic wearout to define effective burn-in screen criteria.

Probe Cards

Wafer-level probe card solutions for die-level HTOL and parametric characterisation. Enables reliability data collection prior to packaging — critical for early characterisation on new process nodes.

Need a Bespoke Test Solution?

Our hardware team can design a custom system, qualification board or driver card for any package type or device configuration. Tell us what you’re testing and we’ll tell you what’s possible.

Request a Quotation

A member of the team will respond to your enquiry.